Richard F. Voss, Robert B. Laibowitz, et al.
Journal of Applied Physics
We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by randomly oriented defects with a density of 5×1017m-2 yield 1/f noise magnitudes in good agreement with experiments. © 2007 The American Physical Society.
Richard F. Voss, Robert B. Laibowitz, et al.
Journal of Applied Physics
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New Journal of Physics
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Physical Review A - AMO
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