Microwave properties of free-standing dielectric films

Abstract

Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.