G. Arjavalingam, Yvon Pastol, et al.
IEEE Trans Antennas Propag
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
G. Arjavalingam, Yvon Pastol, et al.
IEEE Trans Antennas Propag
J.-M. Halbout, G. Arjavalingam, et al.
LEOS 1990
W. Robertson, G. Arjavalingam, et al.
Journal of Applied Physics
S.Y. Lin, G. Arjavalingam, et al.
Journal of Modern Optics