About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Transactions on Magnetics
Paper
Microtrack Profiling Technique for Narrow Track Tape Heads
Abstract
Microtrack properties of magnetoresistive (MR) tape heads are difficult to measure with conventional microtrack profiling techniques. We present a technique for rapid and dynamic measurement of these profiles for tape heads as narrow as 5 µm using a 5 µm wide write head translated on a sinusoidal trajectory. This technique can be used to determine the character and stability of the domain microstructure of the sensor. © 1992 IEEE