Publication
IEEE Transactions on Magnetics
Paper

Microtrack Profiling Technique for Narrow Track Tape Heads

View publication

Abstract

Microtrack properties of magnetoresistive (MR) tape heads are difficult to measure with conventional microtrack profiling techniques. We present a technique for rapid and dynamic measurement of these profiles for tape heads as narrow as 5 µm using a 5 µm wide write head translated on a sinusoidal trajectory. This technique can be used to determine the character and stability of the domain microstructure of the sensor. © 1992 IEEE

Date

Publication

IEEE Transactions on Magnetics

Authors

Share