Mehmet Soyuer, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Related
John D. Cressler, James Warnock, et al.
IEEE Electron Device Letters
Pong-Fei Lu, James D. Warnock, et al.
IEEE T-ED
Chirag S. Patel, Paul S. Andry, et al.
IITC 2005