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IEEE Transactions on Electron Devices
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Joachim N. Burghartz, Michael Hargrove, et al.
IEEE Transactions on Electron Devices
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SiRF 2006
Keith A. Jenkins
IEEE SSC-L
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