Xiaoxiong Gu, Joel A. Silberman, et al.
IEEE Transactions on CPMT
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Xiaoxiong Gu, Joel A. Silberman, et al.
IEEE Transactions on CPMT
Yu-Ming Lin, Hsin-Ying Chiu, et al.
IEEE Electron Device Letters
Keith A. Jenkins, Yu-Ming Lin, et al.
ECS Transactions
Inanc Meric, Cory R. Dean, et al.
IEDM 2011