Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

Keith A. Jenkins; James P. Eckhardt

doi:10.1109/54.844337

IEEE Design and Test of Computers

Paper

01 Apr 2000

Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

View publication

Abstract

Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.

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Low-voltage transient bipolar effect induced by dynamic floating-body charging in scaled PD/SOI MOSFET's

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Abstract

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