Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Related
Conference paper
Copper-filled through wafer vias with very low inductance
Keith A. Jenkins, Chirag S. Patel
IITC 2005
Jonghae Kim, Jean-Olivier Plouchart, et al.
IMS 2003
Phillip J. Restle, Craig A. Carter, et al.
Digest of Technical Papers-IEEE International Solid-State Circuits Conference