Conference paper
Substrate coupling noise issues in silicon technology
Keith A. Jenkins
SiRF 2004
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Related
Keith A. Jenkins, Lionel Li
VTS 2009
Conference paper
On-chip circuit for measuring multi-GHz clock signal waveforms
Keith A. Jenkins, P. Restle, et al.
VTS 2013
Peilin Song, Franco Stellari, et al.
ISTFA 2004