PublicationIEEE Transactions on MagneticsPaperMeasurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscopeIEEE Transactions on MagneticsView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1981PublicationIEEE Transactions on MagneticsAuthorsC.J. AndersonM.B. KetchenIBM-affiliated at time of publicationShare