IEEE Transactions on Magnetics

Paper

01 Jan 1981

Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope

View publication

Abstract

No abstract available.

Related

Paper

Sub-μm, planarized, Nb-AlO_x-Nb Josephson process for 125 mm wafers developed in partnership with Si technology

Conference paper

SOI for a 1-Volt CMOS Technology and Application to a 512kb SRAM with 3.5 ns Access Time

Paper

Symmetry of the order parameter in the high-T_c superconductor YBa₂Cu₃O_{7- δ}

Conference paper

Picosecond pulse propagation on hybrid T_c transmission lines.

View all publications