T. Mizoguchi, T.R. McGuire, et al.
Physical Review Letters
Extending earlier studies of the polar Kerr effect θ of bias sputtered amorphous GdCoMoArO films, we have studied the ellipticity ε of the reflected light, which arises from magnetic circular dichroism. In certain cases εis comparable in size to θ. A surface layer formed by oxidation gives a contribution which adds to the bulk θ but substracts from the bulk ε. The surface layer can be removed and the samples passivated simply by sputter etching. The substrate interface has appreciably different θ and ε from the bulk. The bulk θ and ε both drop with increase in Mo. θ appears insensitive to Gd and O while ε increases with Gd or O. © 1977, IEEE. All rights reserved.
T. Mizoguchi, T.R. McGuire, et al.
Physical Review Letters
A.P. Malozemoff, S. Maekawa
Journal of Applied Physics
R.J. Gambino, T.R. McGuire, et al.
Journal of Applied Physics
L. Krusin-Elbaum, A.P. Malozemoff, et al.
Physica C: Superconductivity and its Applications