Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The conventional result for the screening length in a semiconductor with a discrete impurity level vanishes at absolute zero. When level broadening is included in a self-consistent way, a finite value is obtained. Results for the screening length and the root-mean-square potential fluctuation at absolute zero are given as functions of the degree of compensation. © 1974 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
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