Douglas S. Goodman
Microelectronic Engineering
The line ratio and the ratio of the subresolution line image irradiance extremum normalized to the aberration-free case is explored as a means of assessing aberration balance and as a line-imaging criterion for a photolithographic projection system. © 1994 Optical Society of America.
Douglas S. Goodman
Microelectronic Engineering
Douglas S. Goodman
Applied Optics
Douglas S. Goodman, Joseph E. Gortych
Applied Optics
Douglas S. Goodman, Joseph E. Gortych
Applied Optics