Abstract
Time-resolved thermal profiles produced in a thin film of Al by a pulse of energy from a GaAs laser have been measured by a laser thermoprobe, consisting of an Ar+ laser and a thin film of CdS evaporated onto the Al. A spatial resolution of 0.5 μm and a temporal resolution of 10 nsec were achieved. The measurement is in good agreement with a three-dimensional heat flow calculation. © 1974.