Talia S. Gershon, Douglas M. Bishop, et al.
SPIE Nanoscience + Engineering 2015
Cryogenic focused ion beam (Cryo-FIB) milling at near-grazing angles is employed to fabricate cross-sections on thin Cu(In,Ga)Se2 with >8x expansion in thickness. Kelvin probe force microscopy (KPFM) on sloped cross sections showed reduction in grain boundaries potential deeper into the film. Cryo Fib-KPFM enabled the first determination of the electronic structure of the Mo/CIGSe back contact, where a sub 100 nm thick MoSey assists hole extraction due to 45 meV higher work function. This demonstrates that CryoFIB-KPFM combination can reveal new targets of opportunity for improvement in thin-films photovoltaics such as high-work-function contacts to facilitate hole extraction through the back interface of CIGS.
Talia S. Gershon, Douglas M. Bishop, et al.
SPIE Nanoscience + Engineering 2015
Daeyoung Lim, Richard Haight
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
David B. Mitzi, Teodor K. Todorov, et al.
ACS National Meeting 2011
Talia S. Gershon, Douglas M. Bishop, et al.
Current Opinion in Green and Sustainable Chemistry