Daeyoung Lim, Richard Haight, et al.
Applied Physics Letters
Cryogenic focused ion beam (Cryo-FIB) milling at near-grazing angles is employed to fabricate cross-sections on thin Cu(In,Ga)Se2 with >8x expansion in thickness. Kelvin probe force microscopy (KPFM) on sloped cross sections showed reduction in grain boundaries potential deeper into the film. Cryo Fib-KPFM enabled the first determination of the electronic structure of the Mo/CIGSe back contact, where a sub 100 nm thick MoSey assists hole extraction due to 45 meV higher work function. This demonstrates that CryoFIB-KPFM combination can reveal new targets of opportunity for improvement in thin-films photovoltaics such as high-work-function contacts to facilitate hole extraction through the back interface of CIGS.
Daeyoung Lim, Richard Haight, et al.
Applied Physics Letters
Richard Haight, Talia S. Gershon, et al.
Semiconductor Science and Technology
Leizhi Sun, Richard Haight, et al.
Applied Physics Letters
Armin Rettenberger, Richard Haight
Surface Science