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VTS 2014
Conference paper

Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements

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Abstract

This paper presents a novel and powerful methodology for extracting functional blocks in hardware security and Trojan detection applications. The method is based on our proposed tester-based optical methodology that combines different test patterns, time-integrated and time-resolved emission measurements to identify and localize logic state changes and functional block activity inside a chip in a non invasive fashion. Detailed examples using a mixed-signal chip are presented and discussed to explain our proposed method. © 2014 IEEE.

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VTS 2014

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