About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
VTS 2014
Conference paper
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements
Abstract
This paper presents a novel and powerful methodology for extracting functional blocks in hardware security and Trojan detection applications. The method is based on our proposed tester-based optical methodology that combines different test patterns, time-integrated and time-resolved emission measurements to identify and localize logic state changes and functional block activity inside a chip in a non invasive fashion. Detailed examples using a mixed-signal chip are presented and discussed to explain our proposed method. © 2014 IEEE.