Foreword: Special issue on statistics in quality, industry, and technology

Betty J. Flehinger, Benjamin Reiser, et al.

Technometrics

Emmanuel Yashchin

JASA

Mary Y.L. Wisniewski, Emmanuel Yashchin, et al.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Baozhen Li, Cathryn Christiansen, et al.

Journal of Applied Physics