PaperModeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High ReliabilityWillard G. Bouricius, William C. Carter, et al.IEEE TC
PaperImplementation of an Experimental Fault-Tolerant Memory SystemWilliam C. Carter, Charles E. McCarthyIEEE TC
Conference paperSymbolic simulation for correct machine designWilliam C. Carter, William H. Joyner, et al.DAC 1979