Publication
Journal of Electron Microscopy Technique
Paper

Extending the limit of atomic level grain boundary structure imaging using highresolution electron microscopy

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Abstract

It has been possible to image= 21/[111]21.8tilt boundaries in thin Au films and to deduce their atomic arrangements. These results represent an electron microscopic resolution level of 1.43, attainable with a small amount of image processing, which produces interpretable structure images. This substantial improvement over other recent grain boundary studies, which required about 1.92.0resolution, clearly demonstrates that many more tilt grain boundary orientations are now accessible instead of a limited subset. Copyright1991 WileyLiss, Inc.

Date

04 Feb 2005

Publication

Journal of Electron Microscopy Technique

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