B. Wagle
EJOR
This paper discusses the engineering of electron-beam sys tems for the generation of micron and submicron lithography. Design objectives and options for the electron-beam column, X-Y workpiece stage, laser interferometer, pattern generator, software, and general engineering are the major topics. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.v
B. Wagle
EJOR
M.F. Cowlishaw
IBM Systems Journal
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998