C.T. Chuang, P.F. Lu, et al.
VLSI-TSA 1997
The electrical properties of an 80 signal line microstrip cable for transmitting signals between room-temperature electronics and cryogenic electronics were calculated and verified. The impedance, propagation velocity, skin effect losses, dielectric losses, forward wave cross talk, and backward wave cross talk were investigated for a copper and polyimide microstrip cable. An effective method of reducing forward wave cross talk was discovered. The microstrip cable has a high signal line density, 19.7 lines/cm, and a high bandwidth, dc-1 GHz.
C.T. Chuang, P.F. Lu, et al.
VLSI-TSA 1997
M.B. Ketchen, C.J. Anderson
Applied Physics Letters
J.D. Feder, M. Klein, et al.
IEEE TAS
G.J. Scott, C.J. Anderson
ECOC 1988