Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Paper
Effects of oxygen on the rie characteristics of aluminum films
Abstract
No abstract available.
Related
P.C. Pattnaik, D.M. Newns
Physical Review B
Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992