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Journal of Applied Physics
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Effect of forming gas anneal on Al-SiO2 internal photoemission characteristics

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Abstract

Internal photoemission characteristics from the Al-SiO2 interface are markedly affected by a 400 °C 20 min forming gas (90% N 2 and 10% H2) anneal. The barrier height is raised by about 0.25 eV and the electric field dependence of the photocurrent is increased.

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Journal of Applied Physics

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