Dynamic studies of semiconductor growth processes using in situ electron microscopy

Abstract

The following is an edited transcript from 2000 MRS Outstanding Young Investigator presentation given by Frances M. Ross at the 2000 Materials Research Society Spring Meeting in San Francisco. Ross was cited for her "innovative and powerful experimental studies, based upon development of novel in situ electron microscopy techniques, that have provided fundamental new understanding of nucleation, growth, oxidation, and ecthing processes in a wide range of materials systems." A Webcast of Ross' presentation in Real Media format can be viewed via the MRS Web site, www.mrs.org/multimedia/spring2000/.