IEEE Design and Test of Computers

Paper

01 Jan 1990

Dynamic statistical control of manufacturing test

View publication

Abstract

No abstract available.

Paper

An Application of Statistical Databases in Manufacturing Testing

Sakti P. Ghosh

IEEE Transactions on Software Engineering

Paper

Consecutive Storage of Relevant Records with Redundancy

Sakti P. Ghosh

CACM

Paper

Distributing a Data Base with Logical Associations on a Computer Network for Parallel Searching

Sakti P. Ghosh

IEEE TSE

Paper

Statistical Relational Databases: Normal Forms

Sakti P. Ghosh

IEEE TKDE

View all publications