K.N. Tu, J. Tersoff, et al.
Solid State Communications
The effect of drain voltage scaling on the turn-on behavior of carbon nanotube (CNT) transistors was studied. The decrease in oxide thickness was found to improve the turn-on behavior. Scaling was employed to avoid an exponential increase in off-current with drain voltage, arising due to the schottky barriers modulation at both the source and drain contact.
K.N. Tu, J. Tersoff, et al.
Solid State Communications
G. Grinstein, Yuhai Tu, et al.
Physical Review Letters
J. Tersoff, N.D. Lang
Physical Review Letters
J. Tersoff, Yuhai Tu, et al.
Applied Physics Letters