Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
K.N. Tu
Materials Science and Engineering: A
Ming L. Yu
Physical Review B