Direct Measurement Of The Sensitivity Distribution Of Magnetoresistive Heads By The SXM Technique

Abstract

The sensitivity distribution of a magnetoresistive bead was obtained by using a scanning probe microscope (SXM) technique. This technique allowed us to map with submicron resolution the sensitivity distribution on the air-bearing surface of the MR head in relation to the head structure. It was observed that the shape and location of the sensitivity distribution varied with changes in the sense current. Comparison with micro-track measurements showed qualitatively good agreements. © 1992 IEEE