J.R. Kirtley, C.D. Tesche, et al.
Physical Review Letters
We have used a new technique to measure simultaneously the surface topography and surface potential of current-carrying polycrystalline Au60Pd40 thin films using a scanning tunneling microscope. The variations of the gradients of the surface potential from a macroscopically constant value which are associated with scattering from grain boundaries in these films are observed. We find that the local potential changes abruptly at the boundaries between the grains. © 1988 The American Physical Society.
J.R. Kirtley, C.D. Tesche, et al.
Physical Review Letters
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ICPS Physics of Semiconductors 1984