S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Hiroshi Ito, Reinhold Schwalm
JES
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics