R.W. Gammon, E. Courtens, et al.
Physical Review B
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
R.W. Gammon, E. Courtens, et al.
Physical Review B
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
E. Burstein
Ferroelectrics