Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
In III-V semiconductors a common mode of vacancy migration is by nearest-neighbour hopping. In the presence of Zn diffusion this mode is greatly enhanced. A consequence is the production of antisite defects, which usually become antistructure pairs as the vacancy returns to its original sublattice. Many important deep-level defects involve vacancies during their creation. One should expect to find neutral antistructure pairs in the vicinity of Zn-O luminescence centres, EL2 defects, etc. Much of the mystery of these centres can be attributed to the dipolar interaction of these antistructure pairs with the nominal defects.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering