D.B. Aubertine, M.A. Mander, et al.
Journal of Applied Physics
Ultramicrotomy is shown to be a valuable technique for observing thin films in cross-section. The structure of layered Co-Tb and Mo-Ge films are characterized, with layers as thin as 0.9 nm resolved in the latter. © 1986.
D.B. Aubertine, M.A. Mander, et al.
Journal of Applied Physics
A.F. Marshall, R.H. Hammond, et al.
Journal of Materials Research
T. Suzuki, H.A. Notarys, et al.
SPIE Optical Data Storage Topical Meeting 1992
R.F.C. Farrow, R.F. Marks, et al.
Journal of Applied Physics