Conference paperInvestigation of the numerical accuracy of transmission line-based transient analysis of high-speed interconnects and cablesAndreas C. Cangellaris, Karen M. Coperich, et al.EMC 2001
PaperMichael Hatzakis, semiconductor industry pioneerJ. Paraszczak, J.M. Shaw, et al.Micro and Nano Engineering
PaperHoles trapped near Mg2+ and Al3+ impurities in SrTiO3O.F. Schirmer, W. Berlinger, et al.Solid State Communications
PaperScanning tunneling microscopy and spectroscopy of thin metal films on the GaAs(110) surfaceP. Martensson, R.M. FeenstraJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
