Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
The history and evolution of electron beam based contactless multichip module (MCM) test technology at IBM is described. The feasibility of a new contactless test method based on opens and shorts detection by means of the measurement of net capacitance is demonstrated. A case is given for the economic viability of a tester based on this technique.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
E. Burstein
Ferroelectrics
Michiel Sprik
Journal of Physics Condensed Matter
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011