Ion projection printing for patterning of magnetic media
Andreas Dietzel, Ruediger Berger, et al.
INTERMAG 2002
One of the oldest unresolved problems in physics is the mechanism of charge exchange between contacting surfaces when at least one of them is insulating. We describe a new technique, using force microscopy, for studying this problem with greater lateral resolution than has been previously possible. The force microscope is shown to have 0.2 m lateral resolution and the sensitivity to detect 3 electronic charges. In contact-charging experiments between the microscope tip and polymethyl methacrylate, the charged region was much larger than the expected contact area and bipolar charge exchange was observed. © 1989 The American Physical Society.
Andreas Dietzel, Ruediger Berger, et al.
INTERMAG 2002
J.D. Hannay, R.W. Chantrell, et al.
Journal of Applied Physics
P. Grütter, D. Rugar, et al.
Applied Physics Letters
S. Anders, S. Sun, et al.
Microelectronic Engineering