Publication
IEEE Design and Test of Computers
Review

Concurrent checking of clock signal correctness

View publication

Abstract

Traditional concurrent-checking techniques may not detect the occurrence of the transient faults and resulting errors likely to affect clock signals in VLSI systems. The authors present a new method and self-checking circuit implementation for concurrently checking the correctness of clock distribution network signals in synchronous systems.

Date

Publication

IEEE Design and Test of Computers

Authors

Share