About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Applied Physics Letters
Paper
Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
Abstract
The resolution and wear properties of carbon nanotube and etched-silicon atomic force microscopy probes are compared in intermittent-contact mode. Carbon nanotube probes have at least 20 times the life of etched-silicon probes and provide better resolution at all stages. Sample wear is minimized with carbon nanotube probes. © 2002 American Institute of Physics.