Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

Abstract

The resolution and wear properties of carbon nanotube and etched-silicon atomic force microscopy probes are compared in intermittent-contact mode. Carbon nanotube probes have at least 20 times the life of etched-silicon probes and provide better resolution at all stages. Sample wear is minimized with carbon nanotube probes. © 2002 American Institute of Physics.