J.K. Howard
JVSTA
X-ray diffraction was used to investigate the effect of nitrogen additions on the crystal structure and preferred orientation of FeMn films reactively sputtered in an Ar-N2 ambient. The fcc γ-FeMn phase was stabilized over a range of nitrogen pressures. The fcc FeMn(N) film was then used as a nucleation substrate for the deposition of an FeMn/Permalloy exchange coupled structure. A maximum exchange bias of 60-70 Oe was obtained when the FeMn(N) film was lattice matched to the γ-FeMn structure (a 0=3.63 Å).
J.K. Howard
JVSTA
W.-Y. Lee, J.R. Salem, et al.
Physica C: Superconductivity and its applications
W.-Y. Lee, J.R. Salem, et al.
Thin Solid Films
P.S. Ho, J.K. Howard
Applied Physics Letters