PaperA Josephson Technology System Level ExperimentM.B. Ketchen, B.J. van der Hoeven, et al.IEEE Electron Device Letters
PaperThermally stable ohmic contacts to n-type GaAs. V. Metal-semiconductor field-effect transistors with NiInW ohmic contactsMasanori Murakami, W.H. Price, et al.Journal of Applied Physics
PaperDamped Three-Junction Interferometers for Latching LogicL.M. Geppert, J.H. Greiner, et al.IEEE Transactions on Magnetics