PaperBistable Switching and Conduction Mechanisms in Nb-Nb2O5-Bi JunctionsS. Basavaiah, K.C. ParkIEEE T-ED
PaperA Josephson Technology System Level ExperimentM.B. Ketchen, B.J. van der Hoeven, et al.IEEE Electron Device Letters
PaperAn investigation of the thermal cycling of Pb-alloy Josephson tunneling gatesS. Basavaiah, J.H. GreinerJournal of Applied Physics
Conference paperElectromigration in a two-level Al-Cu interconnection with W studsT. Kwok, C. Tan, et al.VMIC 1990
