Publication
Journal of Applied Physics
Paper

Bloch line influence on wall motion response in thin-film heads

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Abstract

We describe a new dynamic response behavior of domain walls in the permalloy of thin-film inductive heads. A laser magneto-optic microscope (LAMOM) which enhances the longitudinal Kerr effect, is used to image Bloch lines (BLs) within the 180°walls by aligning the optical plane of incidence perpendicular to these walls. BLs are visible due to the reversal in the Néel-type surface components of the wall magnetization at the BL position. Current pulses with fast transition times and ac currents within the frequency range of 1-10 MHz are applied to the integrated coil windings. Continuous excitation induces either a continuous flowing of the wall network or a temporary displacement. When individual pulses are applied, displacements of BLs are observed. Correlation of wall displacements with the BL displacements is demonstrated for some pulsed excitations.

Date

01 Dec 1988

Publication

Journal of Applied Physics

Authors

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