G.S. Agarwal, Sudhanshu S. Jha, et al.
Physical Review B
Backside optical emission was used to diagnose excess quiescent current in a multimillion gate microprocessor. Emission images showed the current was due to FET's improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered.
G.S. Agarwal, Sudhanshu S. Jha, et al.
Physical Review B
A. Frommer, Arza Ron, et al.
Physical Review B
J.C. Tsang, J.E. Smith Jr., et al.
Physical Review B
J.E. Smith Jr., J.C. Tsang, et al.
Solid State Communications