Au/Si(111) overlayer: Characterization by tunneling microscopy and spectroscopy

Abstract

Together with LEED and Auger spectroscopy, Scanning Tunneling Microscopy (STM) and Tunneling Spectroscopy (TS) have been used to characterize about 1 monolayer of Au deposited on a 7 × 7 Si(111) surface and annealed at 600°C. A √3 × √3 R(30°) LEED pattern was observed, whereas STM revealed a 6 × 6 superstructure locally. TS showed strong characteristic resonances in the field-emission range together with a pronounced empty surface state 1 eV above the Fermi level. © 1985.