A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A low-energy electron diffraction intensity analysis of a clean Ni3Al{001} surface confirms the mixed-layer (50% Ni50% Al) termination of this surface and reveals a small contraction of 2.8% of the first interlayer spacing (bulk value 1.78 A), with the Al atoms slightly farther out (0.020.03 A) than the Ni atoms, while the second interlayer spacing is bulklike. © 1986 The American Physical Society.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films