Conference paper
Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
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