S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
Related
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting