Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
Related
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications