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Physica E: Low-Dimensional Systems and Nanostructures
Selective protection of the porosity can be implemented in porous materials processing by using an organic polymer fill. This strategy is employed to protect ultralow-k (ULK) materials during patterning of 250-nm lines and spaces. Structures with significantly less sidewall and trench bottom damage are obtained, proving the potential of this novel approach in materials science. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
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EMC 2011
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