J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
We have observed an anomalous coverage dependence of sputtered Cs+ and Li+ yields from Cs and Li overlayers on Si(111) surfaces. The ion yield reaches a maximum and decreases at higher coverages even when the coverage is still less than a monolayer. We found that this phenomenon is directly related to the effect of the work function on the ionization probability. © 1984 The American Physical Society.
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
T.N. Morgan
Semiconductor Science and Technology