Publication
Physical Review B
Paper

Anomalous coverage dependence of secondary-ion emission from overlayers

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Abstract

We have observed an anomalous coverage dependence of sputtered Cs+ and Li+ yields from Cs and Li overlayers on Si(111) surfaces. The ion yield reaches a maximum and decreases at higher coverages even when the coverage is still less than a monolayer. We found that this phenomenon is directly related to the effect of the work function on the ionization probability. © 1984 The American Physical Society.

Date

15 Feb 1984

Publication

Physical Review B

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