About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Transactions on Magnetics
Paper
Analysis of media defects in thick recording media
Abstract
The defect behavior of thick particulate media is investigated by introducing artificial defects of known depth, measuring their signal loss characteristics as a function of frequency, and then relating actual measured drop-out lengths to the experimentally determined artificial defect depth data. The results indicate that the number of drop-outs per track is exponentially related to a “critical depth” parameter. The data can be used to extrapolate density capabilities of a given medium using a set of experimental artificial defect data taken at a lower performance level. © 1979 IEEE