L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Surface and bulk structures of as-deposited Fe3O4 and post-oxidized γ-Fe2O3 thin films were successfully identified by synchrotron diffraction analysis. A new synchrotron diffraction method which combines the Seemann-Bohlin and the grazing incidence techniques was used to record polycrystalline diffraction patterns for structure depth profiling analysis. The post-oxidized film was found to have an α-Fe2O3 layer at the surface and γ-Fe2O3 in the bulk of the film. The formation of a thermodynamically stable antiferromagnetic α-Fe2O3 surface caused the magnetically dead layer previously detected by neutron reflection analysis. Synchrotron diffraction results also showed that the structure of the as-deposited film remains constant throughout the thickness of the film. The presence of a superlattice (300) peak indicates the film has been oxidized beyond Fe3O4. © 1987.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Kenneth R. Carter, Robert D. Miller, et al.
Macromolecules
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008