Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution, and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams win be reported separately. Copyright © 1968 by The Institute of Electrical and Electronic Engineering, Inc.
Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008
Rajiv Ramaswami, Kumar N. Sivarajan
IEEE/ACM Transactions on Networking
Lixi Zhou, Jiaqing Chen, et al.
VLDB
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007