J. Stöhr, H. Padmore, et al.
Surface Review and Letters
A new method for the absolute measurement of magnetic microstructure at nanometer spatial resolution in magnetic materials has been developed by implementing off-axis electron holography in a scanning transmission electron microscope. The absolute spatial resolution of a few nanometers and absolute sensitivity to 10−15 emu are utilized to examine the magnetic structure in small particles. © 1995 IEEE
J. Stöhr, H. Padmore, et al.
Surface Review and Letters
J. Stöhr, A. Scholl, et al.
Physical Review Letters
R.E. Dunin-Borkowski, M.R. McCartney, et al.
Journal of Applied Physics
J.M. Cowley, M. Mankos, et al.
Ultramicroscopy