C. Narayan, S. Purushothaman, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
Electron diffraction patterns generated from phases that have low crystallographic symmetry are difficult and tedious to analyze by conventional techniques. This paper describes a computation scheme that can index electron diffraction patterns efficiently and quickly and be easily implemented on a personal computer. The technique is based on sorting and searching and is especially useful when rapid analyses of electron diffraction patterns are necessary and the crystalline phase under study has a low symmetry. Copyright © 1986 Wiley‐Liss, Inc.
C. Narayan, S. Purushothaman, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
Robert L. Melcher, P.M. Alt, et al.
IBM J. Res. Dev
J.L. Sanford, P.F. Greier, et al.
IBM J. Res. Dev
F.E. Doany, C. Narayan
IBM J. Res. Dev