Journal of Physics Condensed Matter

A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments

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Addition of an electron energy filter to low energy electron microscopy (LEEM) and photoelectron emission microscopy (PEEM) instruments greatly improves their analytical capabilities. However, such filters tend to be quite complex, both electron optically and mechanically. Here we describe a simple energy filter for the existing IBM LEEM/PEEM instrument, which is realized by adding a single scanning aperture slit to the objective transfer optics, without any further modifications to the microscope. This energy filter displays a very high energy resolution ΔE/E = 2 × 10-5, and a non-isochromaticity of ∼0.5eV/10νm. The setup is capable of recording selected area electron energy spectra and angular distributions at 0.15eV energy resolution, as well as energy filtered images with a 1.5eV energy pass band at an estimated spatial resolution of ∼10nm. We demonstrate the use of this energy filter in imaging and spectroscopy of surfaces using a laboratory-based He I (21.2eV) light source, as well as imaging of Ag nanowires on Si(001) using the 4eV energy loss Ag plasmon. © 2009 IOP Publishing Ltd.