Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
A problem of batching identical jobs on a single machine is studied. Constant processing times and batch setup times are assumed. An algorithm is presented to minimize the sum over all jobs of the batched completion times, and shown to run in time polynomial in the logarithms of the problem parameters. © 1992.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Daniel J. Costello Jr., Pierre R. Chevillat, et al.
ISIT 1997
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994