O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Low energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epitaxial growth, phase transitions, chemisorption and strain relaxation phenomena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilities and greater ease of operation compared to present instruments.
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Ming L. Yu
Physical Review B
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering