Publication
IEEE TC
Paper

A New Empirical Test for the Quality of Random Integer Generators

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Abstract

In a number of applications, it is necessary to generate stimuli: to generate random patterns when random testing of logic faults is employed, and to generate the random occurrence of events when simulation is used, to mention two. In this paper, we show a quick empirical test, which is based on a data compression method, to analyze the pseudorandom integers generated by certain types of random integer generators and to determine whether the approximation to a true random process is good. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.

Date

01 Jan 1983

Publication

IEEE TC

Authors

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